Microstrip circuits for characterization of magnetic thin films. (a) Transmission approach and (b) reflection approach.
Electric field (solid line) and magnetic field (dashed line) distribution at the cross section of the region with the magnetic thin film sample.
Cross section of the microstrip circuit (a) loaded with substrate without thin film and (b) loaded with substrate coated with thin film.
Shorted microstrp line fixture loaded with a magnetic thin film coated on a dielectric substrate. (a) Photograph and (b) schematic diagram.
Magnetic field distributions of the fixture at 4 GHz. (a) Empty fixture. (b) Fixture loaded with a dielectric substrate without magnetic thin film. (c) Fixture loaded with a dielectric substrate coated with magnetic thin film with zero conductivity. (d) Fixture loaded with a dielectric substrate coated with magnetic thin film with conductivity
Magnetization curves of the FeTaN thin film.
Effective parameters of the microstrip line of the fixture at different states. (a) Effective permittivity of the empty fixture. (b) Effective permittivity of the fixture loaded with substrate without film. (c) Effective permeability of the fixture loaded with film coated on substrate.
Permeability spectrum of the magnetic thin film. (a) Theoretical results following Landau–Lifchitz–Gilbert equations. (b) Measurement results based on calibration with substrate without thin film. (c) Measurement results based on calibration with saturation magnetization.
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