Full text loading...
(a) Scanning electron micrograph (SEM) of the four-electrode probe, which was fabricated from a V-shaped tip of a conventional AFM probe. The inset shows the original tip geometry before FIB fabrication. The directions of the tips shown in the two images are opposite. (b) The micro-4P AFM probe cantilever. (c) The well-defined circuitry on the probe surface.
(Color online). (a) AFM surface image obtained by the micro-4P AFM probe scanning. (b) Typical surface topography of the same sample obtained by standard AFM contact mode probe.
(Color online). Current-voltage data of aluminum and ITO thin film samples obtained by the micro-4P AFM probe with a scanning rate of , working environment temperature at , and relative humidity 46.2%. Area scanned is . Data are fitted to linear functions as shown.
Conductivity of the samples obtained by using the 4P AFM probe technique.
Article metrics loading...