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Microscopic four-point atomic force microscope probe technique for local electrical conductivity measurement
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10.1063/1.1988130
/content/aip/journal/rsi/76/8/10.1063/1.1988130
http://aip.metastore.ingenta.com/content/aip/journal/rsi/76/8/10.1063/1.1988130
/content/aip/journal/rsi/76/8/10.1063/1.1988130
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/content/aip/journal/rsi/76/8/10.1063/1.1988130
2005-07-20
2014-07-29
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Microscopic four-point atomic force microscope probe technique for local electrical conductivity measurement
http://aip.metastore.ingenta.com/content/aip/journal/rsi/76/8/10.1063/1.1988130
10.1063/1.1988130
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