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A scanning-electron-microscopy image of the fiber-top cantilever (before the evaporation of the silver layer). The brighter area at the center of the cantilever indicates the presence of a thin platinum layer, which was deposited immediately after the fabrication.
Sketch of the experimental apparatus for contact-mode fiber-top atomic force microscopy (top view, not to scale). The drawing inside the dotted circle represents a close view of the cantilever as it is approaching the grating. Note that the grating is not perfectly parallel to the cantilever. Inset: a schematic view of the light path that allows interferometric measurements of the deflection of the cantilever. The shaded area represents the core of the fiber (not to scale).
Calibration data as a function of time. Top graph: output signal of the readout system of the fiber-top cantilever. Bottom graph: voltage signal applied to the -axis piezoelectric stage. The two crosses indicate the extreme points used for the calibration. The light gray line represents the best linear fit of the data between the two crosses.
Demonstration of the scanning capability of a fiber-top atomic force microscope in contact mode. Top graph: output signal of the readout system of the fiber-top cantilever as a function of time. Bottom graph: voltage signal applied to the -axis piezoelectric stage as a function of time. The shaded area indicates the data reported in Fig. 5 after the elaboration explained in the text.
Elaboration of the data enclosed in the shaded area of Fig. 4. The curve represents the profile of a valley of the grating.
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