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Using an electroconductive carbon nanotube probe tip in scanning nonlinear dielectric microscopy
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10.1063/1.2360985
/content/aip/journal/rsi/77/10/10.1063/1.2360985
http://aip.metastore.ingenta.com/content/aip/journal/rsi/77/10/10.1063/1.2360985
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

The SNDM setup.

Image of FIG. 2.
FIG. 2.

The SEM image of a CNT probe tip.

Image of FIG. 3.
FIG. 3.

(a) The signal image of the domain wall SLT obtained by the SNDM with the CNT probe. (b) The and (c) signal intensity distributions in the domain boundary of SLT. The solid line shows the CNT probe results, while the dashed line corresponds to the Pt-coated probe.

Image of FIG. 4.
FIG. 4.

(a) The fifth scanned signal SNDM image of the multidomain SLT obtained using the CNT probe. (b) The signal intensity distribution on the domain boundary of SLT, after 12 scan repetitions.

Image of FIG. 5.
FIG. 5.

(Color online) Histograms of the domain wall width distribution for both (a) before and (b) after the long-term durability tests. and are, respectively, the average values of for the CNT and Pt-coated probes, shown with their respective standard deviations.

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/content/aip/journal/rsi/77/10/10.1063/1.2360985
2006-10-18
2014-04-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Using an electroconductive carbon nanotube probe tip in scanning nonlinear dielectric microscopy
http://aip.metastore.ingenta.com/content/aip/journal/rsi/77/10/10.1063/1.2360985
10.1063/1.2360985
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