Index of content:
Volume 77, Issue 10, October 2006
- THERMOMETRY; THERMAL DIFFUSIVITY; ACOUSTIC; PHOTOTHERMAL AND PHOTOACOUSTIC
77(2006); http://dx.doi.org/10.1063/1.2356859View Description Hide Description
An acoustic resonant spectroscopy technique for measuring the acoustic impedance,ultrasonic velocity, and density of micron-scale polymer films is developed. The method, which is based on spectral analysis, observes the acoustic resonance between water, the film, and a tungsten plate with high acoustic impedance in the frequency range of . The interface between the film being examined and the plate is vacuum sealed, enabling us to characterize the low-density polyethylene film with acoustic impedances as low as about and the poly(vinyl chloride) film as thin as about . The error in the film density measurements is found to be less than 1%, and the validity of the technique is verified.
77(2006); http://dx.doi.org/10.1063/1.2349601View Description Hide Description
The 3-omega method is widely used to measurethermal properties of thin films and interfaces. Generally, one-dimensional heat conduction across the film is assumed and the film capacitance is neglected. The change in the in-phase (real part) temperature response for the film-on-substrate case relative to the substrate-only case is, therefore, attributed to the sum of the bulk thermal resistance of the film and the thermal boundary resistance between the film and the substrate. Based on a rigorous and intuitive mathematical derivation, it is shown that this approach represents a limiting case, and that its use can cause significant errors in rather realistic situations when the underlying assumptions are not met. This article quantifies the error by introducing a new parameter called the ratio function , which modifies the film thermal resistance and mathematically shows that it depends only on three dimensionless parameters that combine thermal properties and geometries of the film and the heated linewidth. A new data reduction scheme is suggested accordingly to determine the film thermal conductivity (cross-plane), anisotropicthermal conductivity ratio between the in-plane direction and the cross-plane direction, and the interface thermal conductance.