Schematic of the multifunctional TERS instrument based on an inverted confocal microscope.
Example of topographic AFM images (a) in tip-scan mode and (b) in sample-scan mode. The sample is a “fork” of Nanobarcodes on a glass substrate. (c) Cross section of an individual nanorod (white line ). Variations in contrast and resolution are due to different feedback PID parameters used in both scan modes.
Soft contact mode AFM image of bundles of single-walled carbon nanotubes dispersed on a glass slide and a cross section (black line in the image) of some of the individual tubes.
Far-field Raman spectrum of a bundle of single-walled carbon nanotubes spread on a glass substrate. The broad frequency range shows the band, the band, and the band (acquisition time: .).
Tip-enhanced Raman spectra of single-walled carbon nanotubes ropes deposited onto a glass slide with the tip retracted from the sample (bottom trace) and the tip in contact with the sample (top trace). The and bands are marked with an asterisk and a circle, respectively. Experimental conditions: silver-coated tip ( thickness); acquisition time.
Normal and tip-enhanced Raman spectra of brilliant cresyl blue acquired in far-field (black line) and in near-field (grey line) with a silver-coated AFM tip (acquisition time: each).
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