SEM micrograph of AlN specimen.
The schematic diagram of measuring equipment. (1) Loading spring; (2) contact interface layer; (3) NiCr–CuFe thermocouple; (4) second-stage cold head; (5) supporting element; (6) AlN specimen; (7) OFHC specimen; (8) heater; (9) second-stage cold shielding; (10) loading screw; (11) and (18) vacuum gauge; (12) first-stage cold shielding; (13) vacuum container; (14) valve; (15) GM cryocooler; (16) computer; and (17) 2700 multichannel data acquisition.
Circuit diagram of measuring system. (1) Heater of specimens; (2) heater of second cold shielding; (3) and (7) regulating resistance; (4) and (5) power supply; (6) and (8) standard resistance; (9) NiCr–CuFe thermocouple; (10) temperature reference point—freezing point of pure water; (11) Keithly-2700 data-acquisition unit; and (12) computer.
Variation of thermal conductivity of AlN with temperature.
Thermal conductivity of AlN single crystal measured by Slack and Tanzilli.
Variation of TCC with temperature between AlN and OFHC.
Variation of TCC with pressure load between AlN and OFHC.
Variation of TCC with temperature between AlN and Bi2223.
Roughness and flatness of end surfaces on specimens.
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