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Demonstration of low-temperature atomic force microscope with atomic resolution using piezoresistive cantilevers
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10.1063/1.2169469
/content/aip/journal/rsi/77/2/10.1063/1.2169469
http://aip.metastore.ingenta.com/content/aip/journal/rsi/77/2/10.1063/1.2169469
/content/aip/journal/rsi/77/2/10.1063/1.2169469
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/content/aip/journal/rsi/77/2/10.1063/1.2169469
2006-02-14
2014-09-02
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Demonstration of low-temperature atomic force microscope with atomic resolution using piezoresistive cantilevers
http://aip.metastore.ingenta.com/content/aip/journal/rsi/77/2/10.1063/1.2169469
10.1063/1.2169469
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