Schematic diagram of the setup. The filters were also mounted between the PCF and the sample.
Continuum generation (full line) and initial (dashed lines) probe wavelengths.
Time autocorrelation of the probe pulse at a wavelength of selected with a bandpass filter. The time duration of the probe pulse, , is found by adjusting the measurement (symbols) with a Gauss function (solid line).
Measured reflectivity signal obtained for a set of probe wavelength of a tungsten thin film of on a silicon substrate. Measurements are displayed in full lines and calculations in dashed lines.
First experimental (dashed lines) and calculated (full lines) acoustic echoes in a W film obtained for a wavelength pump pulse and for selected wavelengths of a broad wavelength probe pulse.
Reflectivity signal experimentally obtained for a set of probe wavelength for a GaAs film.
Measured (symbols) and calculated frequencies of the Brillouin oscillations detected in the GaAs film at different selected probe wavelengths. The solid line represents the calculated values.
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