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Signal analysis and characterization of experimental setup for the transient thermoreflectance technique
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10.1063/1.2336187
/content/aip/journal/rsi/77/8/10.1063/1.2336187
http://aip.metastore.ingenta.com/content/aip/journal/rsi/77/8/10.1063/1.2336187
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

TTR experimental setup.

Image of FIG. 2.
FIG. 2.

TTR signal demonstrating a signal with a picosecond relaxation time constant. The nontransient and transient signals are on the same order of magnitude. The scan was taken on a Au film deposited on a fused silica substrate.

Image of FIG. 3.
FIG. 3.

TTR signal demonstrating a signal with a picosecond relaxation time constant. The transient signal is stronger than the nontransient signal. The scan was taken on a Au film deposited on a fused silica substrate.

Image of FIG. 4.
FIG. 4.

Normalized results of the scans shown in Figs. 2 and 3 after the phase correction model was used to account for both the magnitude and phase of the signal.

Image of FIG. 5.
FIG. 5.

TTR scan taken on a Pt film deposited on silicon. This decay time constant is on the order of a nanosecond. Both the magnitude and the phase of the signal are still important.

Image of FIG. 6.
FIG. 6.

Schematic of modulation envelope, pump pulses, thermal response, probe pulses, and input signal to the lock-in amplifier vs time. Both axes have arbitrary units and are meant to give a qualitative understanding of signal simulations. In reality pulses are typically apart and there are 38–40 pump pulses per modulation envelope.

Image of FIG. 7.
FIG. 7.

Simulated measured signal and phase using Eqs. (5)–(7) with , , , , and no pump noise. The actual and corrected signals are also shown.

Image of FIG. 8.
FIG. 8.

Error for uncorrected, phase corrected, and offset corrected simulated signals vs for an exponential decay defined by Eq. (9). Case 1: corrected signal for simulated data with no noise nor slow decay . Case 2: and . Case 3: , , and .

Image of FIG. 9.
FIG. 9.

Error for uncorrected, phase corrected, and offset corrected simulated signals vs for a Gaussian decay defined by Eq. (11). , , and .

Image of FIG. 10.
FIG. 10.

Measured probe spot radius and center location at different stage delay times using a sweeping knife edge.

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/content/aip/journal/rsi/77/8/10.1063/1.2336187
2006-08-22
2014-04-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Signal analysis and characterization of experimental setup for the transient thermoreflectance technique
http://aip.metastore.ingenta.com/content/aip/journal/rsi/77/8/10.1063/1.2336187
10.1063/1.2336187
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