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Design and characterization of a movable emittance meter for low-energy electron beams
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10.1063/1.2336763
/content/aip/journal/rsi/77/9/10.1063/1.2336763
http://aip.metastore.ingenta.com/content/aip/journal/rsi/77/9/10.1063/1.2336763
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) HOMDYN simulation of the horizontal emittance and beam envelope evolution along the SPARC photoinjector. is the distance from the cathode, measured along the accelerator axis.

Image of FIG. 2.
FIG. 2.

(Color online) Multislit mask intercepting a space charge dominated beam.

Image of FIG. 3.
FIG. 3.

(Color online) Three-dimensional (3D) mechanical drawing of the SPARC emittance meter. The drawing also shows one of the alignment tools (gray cylinder) which is to be installed, during alignment, on top of the end flanges. Leg extenders are also visible that can be removed if the device is to be installed on a supporting girder.

Image of FIG. 4.
FIG. 4.

(Color online) Analysis of the residual space charge effect after the metallic mask.

Image of FIG. 5.
FIG. 5.

(Color online) The complete slit mask assembled (right) and pictorial of the single components of the slit array.

Image of FIG. 6.
FIG. 6.

(Color online) Optical microscopy pictures of a single slit obtained by mechanical machining (top) compared to the one produced by photochemical machining (bottom). The top picture also shows the sampling window used to compute the local average width.

Image of FIG. 7.
FIG. 7.

(Color online) Beam phase space footprint and multislit measurement simulation at two different points. At the multislit device proves inadequate and a multishot single slit scan must be performed for proper transverse sampling of the beam.

Image of FIG. 8.
FIG. 8.

(Color online) Electron beam imaging using Cr-oxide (top) and Ce-doped YAG radiators (bottom). The gain of the CCD camera had to be set approximately three times higher in the case of Cr-oxide screen to get pixel values comparable to those obtained with Ce:YAG. The rms horizontal size of the beam shown in the picture is .

Image of FIG. 9.
FIG. 9.

On-line measurement of the optical system resolution can be done using the calibration marks on the screen holder.

Image of FIG. 10.
FIG. 10.

(Color online) Emittance blowup as function of the beam misalignment in the bellows. The curves represent the percentage variation of beam rms emittance calculated at the end of the emittance meter (black squares) and at position where the emittance oscillation has a local maximum.

Image of FIG. 11.
FIG. 11.

(Color online) Percentage variation vs of energy spread due to longitudinal wake fields with (red dots) and without (black squares) the contribution of bellows.

Image of FIG. 12.
FIG. 12.

(Color online) Simulation of the beam transverse distribution at the screen in the spectrometer following the emittance meter.

Image of FIG. 13.
FIG. 13.

(Color online) SPARC emittance meter during installation at the Photo Injector Test Facility PITZ.

Image of FIG. 14.
FIG. 14.

(Color online) Picture of the beam at the Ce:YAG screen downstream the multislit mask.

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/content/aip/journal/rsi/77/9/10.1063/1.2336763
2006-09-08
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Design and characterization of a movable emittance meter for low-energy electron beams
http://aip.metastore.ingenta.com/content/aip/journal/rsi/77/9/10.1063/1.2336763
10.1063/1.2336763
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