(Color online) Schematic diagram of the best fabrication process for robust and conductive CNT tips: (a) fabrication of a CNT tip by ac dielectrophoresis, (b) deposition of the amorphous hydrocarbon around the junction portion between the CNT and the W tip by EBD, (c) annealing of the tip at , and (d) coating of the tip with a PtIr layer by PLD.
SEM images of PtIr-coated CNT tips with (a) short and (b) long CNTs, respectively. (c) TEM image of PtIr-coated CNT tip. The inset shows a magnified image of (c).
Two-terminal resistance between tips B and D as a function of number of direct contacts between them. The inset shows a SEM image of the typical contact configuration in multiprobe STM.
(a) SEM image of four-terminal configuration of four PtIr-coated CNT tips in multiprobe STM. (b) Dependence of four-terminal resistance on probe spacing between tips B and C . The dashed line indicates the boundary between the CNT and the supporting W tip of tip A. The inset shows current passing through tips A and D vs the voltage drop between tips B and C at .
(a) TEM image of PtIr-coated CNT tip (tip A) after the four-terminal measurement and (b) magnified image of adhesion area. (c) High-resolution TEM image and (d) selected-area electron diffraction pattern of exposed CNT area in (a).
Summary of survival rates of CNT tips treated by different processes.
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