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High-yield synthesis of conductive carbon nanotube tips for multiprobe scanning tunneling microscope
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10.1063/1.2432253
/content/aip/journal/rsi/78/1/10.1063/1.2432253
http://aip.metastore.ingenta.com/content/aip/journal/rsi/78/1/10.1063/1.2432253

Figures

Image of FIG. 1.
FIG. 1.

(Color online) Schematic diagram of the best fabrication process for robust and conductive CNT tips: (a) fabrication of a CNT tip by ac dielectrophoresis, (b) deposition of the amorphous hydrocarbon around the junction portion between the CNT and the W tip by EBD, (c) annealing of the tip at , and (d) coating of the tip with a PtIr layer by PLD.

Image of FIG. 2.
FIG. 2.

SEM images of PtIr-coated CNT tips with (a) short and (b) long CNTs, respectively. (c) TEM image of PtIr-coated CNT tip. The inset shows a magnified image of (c).

Image of FIG. 3.
FIG. 3.

Two-terminal resistance between tips B and D as a function of number of direct contacts between them. The inset shows a SEM image of the typical contact configuration in multiprobe STM.

Image of FIG. 4.
FIG. 4.

(a) SEM image of four-terminal configuration of four PtIr-coated CNT tips in multiprobe STM. (b) Dependence of four-terminal resistance on probe spacing between tips B and C . The dashed line indicates the boundary between the CNT and the supporting W tip of tip A. The inset shows current passing through tips A and D vs the voltage drop between tips B and C at .

Image of FIG. 5.
FIG. 5.

(a) TEM image of PtIr-coated CNT tip (tip A) after the four-terminal measurement and (b) magnified image of adhesion area. (c) High-resolution TEM image and (d) selected-area electron diffraction pattern of exposed CNT area in (a).

Tables

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Table I.

Summary of survival rates of CNT tips treated by different processes.

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/content/aip/journal/rsi/78/1/10.1063/1.2432253
2007-01-25
2014-04-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: High-yield synthesis of conductive carbon nanotube tips for multiprobe scanning tunneling microscope
http://aip.metastore.ingenta.com/content/aip/journal/rsi/78/1/10.1063/1.2432253
10.1063/1.2432253
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