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Demonstration of magnetoelectric scanning probe microscopy
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10.1063/1.2777197
/content/aip/journal/rsi/78/10/10.1063/1.2777197
http://aip.metastore.ingenta.com/content/aip/journal/rsi/78/10/10.1063/1.2777197
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) ME signal vs ac field. The slope of the curve indicates that the sensor has a sensitivity of over an ac field range of . The inset shows a calibration scan of a ME device. The peak in ME signal is at an applied dc field of with an of .

Image of FIG. 2.
FIG. 2.

(Color online) A schematic of the scanning near-field magnetic field probe setup. The dc field is applied parallel to the field annealed axis of the Metglas. A motion control program is used to scan the sensor across the ring. The active part of the trilayer device is shown.

Image of FIG. 3.
FIG. 3.

A one-dimensional (1D) scan of a ring carrying a current of . The cross section of the wires of the ring is shown to denote the wire position, but is not to scale.

Image of FIG. 4.
FIG. 4.

A series of line scans taken for different through the ring. The data have been multiplied by 1, 5, and 30 for , , and , respectively. The cross section of the wires of the ring is shown to denote the wire position, but is not to scale.

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/content/aip/journal/rsi/78/10/10.1063/1.2777197
2007-10-04
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Demonstration of magnetoelectric scanning probe microscopy
http://aip.metastore.ingenta.com/content/aip/journal/rsi/78/10/10.1063/1.2777197
10.1063/1.2777197
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