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Atomic force microscopy: Loading position dependence of cantilever spring constants and detector sensitivity
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10.1063/1.2805518
/content/aip/journal/rsi/78/11/10.1063/1.2805518
http://aip.metastore.ingenta.com/content/aip/journal/rsi/78/11/10.1063/1.2805518
/content/aip/journal/rsi/78/11/10.1063/1.2805518
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/content/aip/journal/rsi/78/11/10.1063/1.2805518
2007-11-15
2014-09-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Atomic force microscopy: Loading position dependence of cantilever spring constants and detector sensitivity
http://aip.metastore.ingenta.com/content/aip/journal/rsi/78/11/10.1063/1.2805518
10.1063/1.2805518
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