Full text loading...
Experimental test chamber setup (not to scale) for the temperature measurement. The dashed line indicates the copper heat shield (thermal insulation) between the outer vacuum chamber and the inner temperature-controlled (down to ) chamber. The temperature of the detector holder is measured by means of a silicon diode. The photomultiplier tube is mounted outside the vacuum system. The region inside the inner solid line is the cryogenically cooled region.
Temperatures (◼) of the aluminum holder during the cooling down phase and simultaneously measured MCP bias currents (●) The final temperature of the MCP was reached in about four days.
The bias current as a function of temperature from our measurement (●) and from Schecker et al. (Ref. 4) (◇). Our data are normalized to the value of Schecker et al. at (see text).
The count rate as a function of temperature. The scale to the right shows the dark count rate (◆). The left scale shows the count rate measured using the -source, of (●).
The left and right panels show the measured PMT signals and pulse height distributions vs temperature, respectively. The temperature of each measurement is indicated in the right panel with room temperature at the top. The solid triangles shown in the left panel indicates the decay time to 20% of the peak value. Note the voltage log scale on the left panel.
The decay time of the phosphor screen (to 10% of peak amplitude) vs temperature (see text). Lines between the data points are to guide the eye.
Summary of the results for the measured MCP bias current from the present study, together with those reported by Schecker et al. (Ref. 4) and Roth et al. (Ref. 5). The columns show the following (from left to right): The study and MCP type, the total length to diameter ratio of the MCP channels, the diameter of active MCP area, the temperature intervals and bias current ratios without particle source, and the bias voltage.
Article metrics loading...