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Measuring material softening with nanoscale spatial resolution using heated silicon probes
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10.1063/1.2435589
/content/aip/journal/rsi/78/2/10.1063/1.2435589
http://aip.metastore.ingenta.com/content/aip/journal/rsi/78/2/10.1063/1.2435589
/content/aip/journal/rsi/78/2/10.1063/1.2435589
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/content/aip/journal/rsi/78/2/10.1063/1.2435589
2007-02-07
2014-12-22
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Measuring material softening with nanoscale spatial resolution using heated silicon probes
http://aip.metastore.ingenta.com/content/aip/journal/rsi/78/2/10.1063/1.2435589
10.1063/1.2435589
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