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In-plane rigid-body vibration mode characterization with a nanometer resolution by stroboscopic imaging of a microstructured pattern
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10.1063/1.2472604
/content/aip/journal/rsi/78/2/10.1063/1.2472604
http://aip.metastore.ingenta.com/content/aip/journal/rsi/78/2/10.1063/1.2472604
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Principle of position measurement by vision. The mobile target is represented by the dot pattern referenced by in the object plane; : image of ; : image sensor reference coordinate system.

Image of FIG. 2.
FIG. 2.

Dot pattern as recorded on an inspected target.

Image of FIG. 3.
FIG. 3.

Modulus of the Fourier spectrum of the dot pattern image.

Image of FIG. 4.
FIG. 4.

Up: set of continuous lines given by the real part of ; down: angle of .

Image of FIG. 5.
FIG. 5.

Up: set of continuous lines given by the real part of ; down: angle of .

Image of FIG. 6.
FIG. 6.

Unwrapped phase planes on the image center. Up: from ; bottom: from .

Image of FIG. 7.
FIG. 7.

Up: Results of image correlation between the recorded dot pattern image and the simulated one. Down: correlation profile along line 66.

Image of FIG. 8.
FIG. 8.

Experimental setup used; focus is made on the end side of the prong where the dot pattern is strobed by the light emitting diode.

Image of FIG. 9.
FIG. 9.

Reconstructed displacement of the prong for different excitation voltages (from top to bottom: 250, 50, and 0 mV).

Image of FIG. 10.
FIG. 10.

Power spectrum of the displacement distribution as measured for different excitation voltages (from top to bottom: 250, 50, and 0 mV).

Image of FIG. 11.
FIG. 11.

Reconstructed calibration curve of the prong displacement vs excitation voltage for the overtone mode and for the two directions.

Image of FIG. 12.
FIG. 12.

Reconstructed angle for the torsion mode at 4 V excitation.

Image of FIG. 13.
FIG. 13.

Reconstructed calibration curve of the prong rotation amplitude versus excitation voltage for the torsion mode. The inset illustrates the prong torsion in this mode.

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/content/aip/journal/rsi/78/2/10.1063/1.2472604
2007-02-28
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: In-plane rigid-body vibration mode characterization with a nanometer resolution by stroboscopic imaging of a microstructured pattern
http://aip.metastore.ingenta.com/content/aip/journal/rsi/78/2/10.1063/1.2472604
10.1063/1.2472604
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