No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Quantitative extraction of spectral line intensities and widths from x-ray spectra recorded with gated microchannel plate detectors
Data & Media loading...
Article metrics loading...
Full text loading...