Index of content:
Volume 78, Issue 7, July 2007
- THERMOMETRY; THERMAL DIFFUSIVITY; ACOUSTIC; PHOTOTHERMAL AND PHOTOACOUSTIC
78(2007); http://dx.doi.org/10.1063/1.2754401View Description Hide Description
This article describes a methodology and an apparatus used to evaluate the onset time of free convection in hot-wire experiments. The evaluation of the onset time is useful to obtain a measurement interval that is suitable to estimate the thermal properties of a fluid. If a pure conduction regime is present, the hot-wire temperature increment versus time is a straight line in a semilog plot, whereas the convection effect induces a deviation from this trend. An algorithm based on the F test is proposed to evaluate the onset time of free convection. The experimental facility has the particular feature of allowing an easy change of the hot-wire inclination angle up to . The wire is kept in a tilted position by a permanent horseshoe magnet, and the tilting angle from the vertical is measured by a theodolite. Some testing results using water are discussed for vertical and inclined wires. A good agreement between the experimental onset times and the theoretical ones is found in the case of a vertical wire.
Laser scanning thermoreflectance imaging system using galvanometric mirrors for temperature measurements of microelectronic devices78(2007); http://dx.doi.org/10.1063/1.2757473View Description Hide Description
We present a thermoreflectance imaging system using a focused laser sweeping the device under test with a scanner made of galvanometric mirrors. We first show that the spatial resolution of this setup is submicrometric, which makes it adapted to microelectronic thermal measurements. Then, we studied qualitative temperature variations on two dissipative structures constituted of thin dissipative resistors, the distance between two resistors being equal to 0.8 or . This technique combines sensitivity and speed: it is faster than a point classical thermoreflectance technique and, in addition, more sensitive than a charge-coupled device thermoreflectance imaging technique.
78(2007); http://dx.doi.org/10.1063/1.2756740View Description Hide Description
A quartz crystal microbalance (QCM) is described, which is based on a torsional resonator, rather than a conventional thickness-shear resonator. Typical applications are measurements of film thickness in the coating industry and monitoring of biofouling. The torsional QCM is about a factor of 100 less sensitive than the conventional QCM. On the other hand, it can probe film thicknesses in the range of hundreds of microns, which is impossible with the conventional QCM due to viscoelastic artifacts. Data acquisition and data analysis proceed in analogy to the conventional QCM. An indicator of the material’s softness can be extracted from the bandwidth of the resonance. Within the small-load approximation, the frequency shift is independent of whether the sample is applied to the face or to the side of the cylinder. Details of the geometry matter if the viscoelastic properties of the sample are of interest.