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Characterization of thermoelectric elements and devices by impedance spectroscopy
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10.1063/1.2775432
/content/aip/journal/rsi/78/9/10.1063/1.2775432
http://aip.metastore.ingenta.com/content/aip/journal/rsi/78/9/10.1063/1.2775432

Figures

Image of FIG. 1.
FIG. 1.

Electrical circuit describing the steady state electrical properties of a TE module.

Image of FIG. 2.
FIG. 2.

(a) Experimental setup for ac measurements. Diagram for (b) a inline module, (c) a commercially available TE module or simple unicouple, and (d) a - or -type TE leg. Permission granted from Materials Research Society (Ref. 11).

Image of FIG. 3.
FIG. 3.

circuit for one-port analysis.

Image of FIG. 4.
FIG. 4.

Thermal impedance related to electrical impedance.

Image of FIG. 5.
FIG. 5.

ac thermal-electrical model for a TE module. Permission granted from Materials Research Society (Ref. 11).

Image of FIG. 6.
FIG. 6.

Transmission line model for a TE module where is the thermal impedance. Permission granted from Materials Research Society (Ref. 11).

Image of FIG. 7.
FIG. 7.

Magnitude and phase of the impedance versus frequency for (a) a commercially available TE module using , (b) a inline module consisting of from a commercially available module, and (c) a single TE leg of a -type sample . Permission granted from Materials Research Society (Ref. 11).

Image of FIG. 8.
FIG. 8.

(Color online) (a) Diagram of module (LAST and LASTT) for infrared imaging. [(b)–(d)], Infrared imaging of a TE module using an ac signal showing the temperature profile along the -type material at three moments in time. Permission granted from Materials Research Society (Ref. 11).

Image of FIG. 9.
FIG. 9.

Example of a long vs a short sample of -type . Solid data points are magnitude and hollow points are phase. Square data points are the long sample and triangle points are the short sample.

Image of FIG. 10.
FIG. 10.

vs maximum absolute phase angle for an equivalent circuit.

Image of FIG. 11.
FIG. 11.

Phase vs log frequency.

Image of FIG. 12.
FIG. 12.

Phase and magnitude plots vs log frequency.

Image of FIG. 13.
FIG. 13.

Comparing digital vs ac lock-in technique using . The squares and triangles are the magnitude and phase of the impedance, respectively, using the ac lock-in technique. The circles are the resistance measurements using the digital technique.

Image of FIG. 14.
FIG. 14.

direct vs indirect measurements at low temperatures of undoped and constantan. The reference line is for constantan only.

Image of FIG. 15.
FIG. 15.

(a) Diagram for mounting the TE sample at high temperatures. (b) sample with platinum wires ) resistive welded to sample. (c) sample suspended in the UHT system.

Image of FIG. 16.
FIG. 16.

Resistance vs frequency at various temperatures of .

Image of FIG. 17.
FIG. 17.

Measured resistivity of the sample compared to Ames Laboratory measurements.

Image of FIG. 18.
FIG. 18.

of values measured vs temperature compared to -type . This plot shows the corrected for the measurement wires but not including radiation losses and the measured that has been corrected for radiation losses using an emissivity value of 0.7.

Image of FIG. 19.
FIG. 19.

[(a) and (b)] Mounting constantan wire for measurement in the UHT system. (c) Constantan wire probe spacings.

Image of FIG. 20.
FIG. 20.

Magnitude of impedance vs frequency at multiple temperatures.

Image of FIG. 21.
FIG. 21.

Phase of impedance vs frequency at multiple temperatures.

Image of FIG. 22.
FIG. 22.

Experimental results for measuring of constantan.

Image of FIG. 23.
FIG. 23.

Diagram for the steady state analysis of radiation losses for an applied dc current.

Image of FIG. 24.
FIG. 24.

Analyzing radiation losses for a linear temperature gradient along the length of the sample divided into four sections.

Tables

Generic image for table
Table I.

ac TE module model results.

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/content/aip/journal/rsi/78/9/10.1063/1.2775432
2007-09-20
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Characterization of thermoelectric elements and devices by impedance spectroscopy
http://aip.metastore.ingenta.com/content/aip/journal/rsi/78/9/10.1063/1.2775432
10.1063/1.2775432
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