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Experimental technique for reducing contact and background noise in voltage spectral density measurements
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10.1063/1.2786271
/content/aip/journal/rsi/78/9/10.1063/1.2786271
http://aip.metastore.ingenta.com/content/aip/journal/rsi/78/9/10.1063/1.2786271

Figures

Image of FIG. 1.
FIG. 1.

Schematic display of two- and four-probe techniques for measuring resistance. In the four-probe technique the bias current is injected through the two outer contacts, and the voltage is measured across the two inner contacts. In the two-probe technique the same contacts are used for current biasing and voltage measurement.

Image of FIG. 2.
FIG. 2.

Sketch of noise measurement setup. The sample equivalent circuit is shown inside the dashed box and is represented by the resistances , , and , each with an associated noise source . The noise measurements are performed with both two- and four-probe configurations.

Image of FIG. 3.
FIG. 3.

(Color online) Microphotograph of a planar structure patterned in the investigated LSMO thin film consisting in a wide horizontal line and several tracks to perform electrical transport and noise measurements. Voltage probes are placed on each side of the line.

Image of FIG. 4.
FIG. 4.

Noise voltage spectral densities, and , generated by the bias resistor and the preamplifier, respectively. The experimental spectral density, measured with no current flowing in the bias circuit , is also reported.

Image of FIG. 5.
FIG. 5.

Frequency dependence, at a constant current and at temperature , of noise voltage spectral densities measured across the current contacts (: gray curve) and across the voltage contacts (: black curve), using a two-probe and a four-probe technique respectively. The spectral trace, obtained by applying the proposed experimental procedure (: curve), is also shown.

Image of FIG. 6.
FIG. 6.

Bias current dependencies, at temperature and at a frequency , of the measured (open circles) and of the corrected (full circles) voltage spectral density components. The curves are fittings of the data using a second order polynomial. The values of the fitting parameters are reported in Table II.

Tables

Generic image for table
Table I.

Measured values of the resistances and the capacitance used. The reported quantities are referred to the case study of the sample: LSMO/STO(100)-G237 (; ; ).

Generic image for table
Table II.

Fitting coefficients of Eq. (11) for the spectral density component of the experimentally measured trace and of the corrected trace .

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/content/aip/journal/rsi/78/9/10.1063/1.2786271
2007-09-26
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Experimental technique for reducing contact and background noise in voltage spectral density measurements
http://aip.metastore.ingenta.com/content/aip/journal/rsi/78/9/10.1063/1.2786271
10.1063/1.2786271
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