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Inspection of refractive x-ray lenses using high-resolution differential phase contrast imaging with a microfocus x-ray source
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10.1063/1.2786273
/content/aip/journal/rsi/78/9/10.1063/1.2786273
http://aip.metastore.ingenta.com/content/aip/journal/rsi/78/9/10.1063/1.2786273
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

X-ray beam path through a converging x-ray lens. The focal length of the lens is denoted by and the radius of curvature at the center of the parabolas by .

Image of FIG. 2.
FIG. 2.

Setup for differential phase contrast imagings using projection magnification. The setup is based on a phase grating and an absorption grating, which are denoted by and , respectively.

Image of FIG. 3.
FIG. 3.

Characterization of the refractive properties of a converging x-ray lens made of beryllium based on the beam deflection angle. The measured beam deflection angle in the direction is presented in (a). In (b), a comparison of a line plot along the axis of (solid line) to its linear target behavior (dashed line) is shown. Lens errors can be characterized based on the difference between these two functions, which is illustrated as spatially resolved in (c) and as a line plot along the axis in (d).

Image of FIG. 4.
FIG. 4.

Characterization of the refractive properties of a converging x-ray lens made of beryllium based on the total phase shift of x rays transmitted through the lens, which can be directly related to the lens thickness. The measured (solid line) and the target behavior (dashed line) are shown in (a) and the difference of these two functions is displayed in (b).

Image of FIG. 5.
FIG. 5.

Characterization of the refractive properties of a converging x-ray lens made of beryllium based on the beam deflection angle. The figure exhibits the deviation of the measured beam deflection angle in radial direction from its target value. The contour lines correspond to a deviation of 0.012, 0.024, , etc.

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/content/aip/journal/rsi/78/9/10.1063/1.2786273
2007-09-26
2014-04-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Inspection of refractive x-ray lenses using high-resolution differential phase contrast imaging with a microfocus x-ray source
http://aip.metastore.ingenta.com/content/aip/journal/rsi/78/9/10.1063/1.2786273
10.1063/1.2786273
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