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A simple method for producing flattened atomic force microscopy tips
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    1 Nano-Optics Group, National Center of Competence for Research in Nanoscale Science, Institute of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel, Switzerland
    a) Electronic mail: paolo.biagioni@polimi.it. Present address: LNESS, Dipartimento di Fisica, Politecnico di Milano, piazza Leonardo da Vinci 32, I-20133 Milano, Italy.
    b) Present address: Empa, Ueberlandstrasse 129, CH-8600 Dübendorf, Switzerland.
    c) Present address: Ciba Specialty Chemicals Inc., CH-4002 Basel, Switzerland.
    d) Present address: DFG Heisenberg Group, “Nanoscale Science,” Lichttechnisches Institut, Universität Karlsruhe (TH), Kaiserstraße 12, D-76131 Karlsruhe, Germany.
    e) Electronic mail: hecht@physik.uni-wuerzburg.de. Present address: Nano-Optics and Bio-Photonics, Wilhelm Conrad Röntgen Research Center for Complex Material Systems (RCCM), Department of Experimental Physics 5, University of Würzburg, Am Hubland, D-97074 Würzburg, Germany.
    Rev. Sci. Instrum. 79, 016103 (2008); http://dx.doi.org/10.1063/1.2834875
View: Figures


Image of FIG. 1.
FIG. 1.

Representative scanning electron microscopy images of two AFM tips after the flattening procedure: side views [(a) and (b)] and top views [(c) and (d)].

Image of FIG. 2.
FIG. 2.

Thermal imaging topography map of an AFM tip scanned over the focus of the objective (scale bar here represents height variations due to thermal effects).


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Scitation: A simple method for producing flattened atomic force microscopy tips