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Analysis methodology of movable emittance-meter measurements for low energy electron beams
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10.1063/1.2835715
/content/aip/journal/rsi/79/1/10.1063/1.2835715
http://aip.metastore.ingenta.com/content/aip/journal/rsi/79/1/10.1063/1.2835715
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Illustration of the slit based emittance measurement scheme.

Image of FIG. 2.
FIG. 2.

Typical beamlet image and its profile for a horizontal emittance measurement.

Image of FIG. 3.
FIG. 3.

Examples of different signal noise suppression: red curve is the original signal, blue curve is the Gaussion fit to detect the signal, and green curve is the signal after denoising. In the signal region, the red curve is not visible because it is superimposed to the green one.

Image of FIG. 4.
FIG. 4.

Ratios (red curves) and (black curves) as a function of the Gaussian profile height. Squares are data for , triangles for while diamonds for .

Image of FIG. 5.
FIG. 5.

Ratios (red curves) and (black curves) as a function of the truncated Gaussian profile height. Squares are data for , triangles for , while diamonds for .

Image of FIG. 6.
FIG. 6.

Ratios and for a Gaussian noisy profile as a function of the signal to noise ratio. Squares are data for , red dots for , green triangles for , while blue triangles for .

Image of FIG. 7.
FIG. 7.

Blank image discarded at the first step of the profile selection algorithm: the red curve is the original signal, the blue curve is the Gaussian fit to detect the signal, and green curve is the signal after denoising.

Image of FIG. 8.
FIG. 8.

Footprints of a typical emittance measurement. Each of the columns is associated to a slit position, while the number of lines is equal to the number of acquired images . White squares stand for selected images, while black ones correspond to discarded images. The left plot is the measurement as it is while the right one is the same measurement after the shuffling to maximize the number of white squares per line.

Image of FIG. 9.
FIG. 9.

Example of measurement analysis (Ref. 3). ( bunch at with laser spot size of and laser flat pulse with rise time full width at half maximum (FWHM), , ).

Image of FIG. 10.
FIG. 10.

Example of a measured trace space reconstruction for .

Image of FIG. 11.
FIG. 11.

Trace spaces reconstructed with different interpolation algorithms: standard two-dimensional (2D) linear interpolation (left picture) and one-dimensional (1D) interpolation along the trace space axis (right plot).

Image of FIG. 12.
FIG. 12.

GMESA fitting ellipse for different charge cuts compared to experimental trace space at the emittance scan relative maximum.

Image of FIG. 13.
FIG. 13.

Comparison between algorithms for emittance calculation (Ref. 6).

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/content/aip/journal/rsi/79/1/10.1063/1.2835715
2008-01-25
2014-04-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Analysis methodology of movable emittance-meter measurements for low energy electron beams
http://aip.metastore.ingenta.com/content/aip/journal/rsi/79/1/10.1063/1.2835715
10.1063/1.2835715
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