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Time-of-flight neutral particle analyzer and calibrationa)
a)Contributed paper, published as part of the Proceedings of the 17th Topical Conference on High-Temperature Plasma Diagnostics, Albuquerque, New Mexico, May 2008.
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10.1063/1.2955616
/content/aip/journal/rsi/79/10/10.1063/1.2955616
http://aip.metastore.ingenta.com/content/aip/journal/rsi/79/10/10.1063/1.2955616
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Illustration of the TOF diagnostic.

Image of FIG. 2.
FIG. 2.

Synchronization circuit allowing a variable delay between system firing and the initial slit open time.

Image of FIG. 3.
FIG. 3.

Shot 2300—pulses from lithium ion source. Emitter bias , chop frequency . Two neutrals are observed near and one at . The amplitude differences are attributed to the pulse height distribution (Ref. 10).

Image of FIG. 4.
FIG. 4.

Lithium ion energy scan. Expected trend (solid) represents a 1:1 correspondence between ion energy and emitter bias. Best-fit line (dashed) falls within error bars.

Image of FIG. 5.
FIG. 5.

Lithium ion distribution function for bias in time domain as measured by TOF diagnostic (boxes) where data are binned into intervals. The Maxwell–Boltzman distribution comparison (solid) with temperature and drift convoluted with the aperture function and compared to convoluted biased plate collector data (dashed) from the ion beam calibration (Ref. 13).

Image of FIG. 6.
FIG. 6.

TOF data from IFRC for CEM biased at . The data have been smoothed over for (a) and (b). The photon peaks are shown in (a), while the neutral signal in (b) has been zoomed to show response from individual ions in (c).

Image of FIG. 7.
FIG. 7.

Ion distribution function measured by TOF diagnostic compared to a Gaussian fit.

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/content/aip/journal/rsi/79/10/10.1063/1.2955616
2008-10-31
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Time-of-flight neutral particle analyzer and calibrationa)
http://aip.metastore.ingenta.com/content/aip/journal/rsi/79/10/10.1063/1.2955616
10.1063/1.2955616
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