Illustration of the TOF diagnostic.
Synchronization circuit allowing a variable delay between system firing and the initial slit open time.
Shot 2300—pulses from lithium ion source. Emitter bias , chop frequency . Two neutrals are observed near and one at . The amplitude differences are attributed to the pulse height distribution (Ref. 10).
Lithium ion energy scan. Expected trend (solid) represents a 1:1 correspondence between ion energy and emitter bias. Best-fit line (dashed) falls within error bars.
Lithium ion distribution function for bias in time domain as measured by TOF diagnostic (boxes) where data are binned into intervals. The Maxwell–Boltzman distribution comparison (solid) with temperature and drift convoluted with the aperture function and compared to convoluted biased plate collector data (dashed) from the ion beam calibration (Ref. 13).
TOF data from IFRC for CEM biased at . The data have been smoothed over for (a) and (b). The photon peaks are shown in (a), while the neutral signal in (b) has been zoomed to show response from individual ions in (c).
Ion distribution function measured by TOF diagnostic compared to a Gaussian fit.
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