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Measurement and modeling of pulsed microchannel plate operation (invited)a)
a)Invited paper, published as part of the Proceedings of the 17th Topical Conference on High-Temperature Plasma Diagnostics, Albuquerque, New Mexico, May 2008.
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View: Figures


Image of FIG. 1.
FIG. 1.

(a) Cross-sectional schematic illustration of the steady-state model for MCP operation. (b) Comparison of the relative sensitivity as a function of applied steady-state voltage for a MCP with as measured on a Manson x-ray source at (points) and simulated by the Monte Carlo model at the best-fit secondary yield parameters (solid line).

Image of FIG. 2.
FIG. 2.

(a) Picture of the National Security Technologies Model H-CA-63 MCP camera. (b) Schematic of the internal circuitry in the H-CA-63 MCP camera. The red dot represents the location of a probe point for measuring the time-dependent surface voltage.

Image of FIG. 3.
FIG. 3.

Modeled surface voltage (black solid) from Eq. (4) compared to the probe measurements (black points) at positions of (a) and (b) from the end of the striplines. The surface voltage is the composite of many forward going, (solid), and backward going, (dashed), pulses as illustrated for (red), 1 (green), and 2 (blue). The measured surface voltage is used as input to Monte Carlo simulations of the time-dependent gain (red solid with error bars).

Image of FIG. 4.
FIG. 4.

Measured (black points) and simulated (red points) FWHM of the time-dependent MCP gain at different distances away from the end of the striplines.

Image of FIG. 5.
FIG. 5.

Measured (black) and simulated (red) time-dependent gain profiles at positions of (a) and (b) from the end of the striplines.

Image of FIG. 6.
FIG. 6.

Self-emission x-ray pinhole images of an imploding Z pinch taken with the H-CA-64 MCP camera at Sandia National Laboratories’ Z facility. The Z-pinch axis is along the length of the stripline. The images are taken with a interframe time covering a total span of .


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Scitation: Measurement and modeling of pulsed microchannel plate operation (invited)a)