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Robust measurement of group delay in the presence of density fluctuations by means of ultrafast swept reflectometrya)
a)Contributed paper, published as part of the Proceedings of the 17th Topical Conference on High-Temperature Plasma Diagnostics, Albuquerque, New Mexico, May 2008.
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10.1063/1.2971973
/content/aip/journal/rsi/79/10/10.1063/1.2971973
http://aip.metastore.ingenta.com/content/aip/journal/rsi/79/10/10.1063/1.2971973
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Sketch of the model used to mimic the plasma reflection.

Image of FIG. 2.
FIG. 2.

fluctuation distribution and reflected power at a fixed frequency .

Image of FIG. 3.
FIG. 3.

Simulation of the received reflectometric signal at a fixed frequency (; ); left: complex amplitude-phase diagram; right: cosine (homodyne) signal.

Image of FIG. 4.
FIG. 4.

fluctuation and reflected power at a fixed frequency .

Image of FIG. 5.
FIG. 5.

Simulation of received reflectometric signal at a fixed frequency (; ); left: complex amplitude-phase diagram; right: cosine (homodyne) signal.

Image of FIG. 6.
FIG. 6.

Simulation of the received reflectometric signal with a slow frequency sweep (; ; ); left: complex amplitude-phase diagram; right: cosine (homodyne) signal.

Image of FIG. 7.
FIG. 7.

Simulation of the received reflectometric signal with a fast frequency sweep (; ; ); left: complex amplitude-phase diagram; right: cosine (homodyne) signal.

Image of FIG. 8.
FIG. 8.

Simulation of received reflectometric signal on a transverse traveling wave highlighting the Doppler effect (; ; ); left: complex amplitude-phase diagram; right: cosine (homodyne) signal.

Image of FIG. 9.
FIG. 9.

Homodyne signal and modulating control current obtained from the reflectometer of RFX with a metallic mirror: upper panel with a sweep time; lower panel with a 200 ns sweep time.

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/content/aip/journal/rsi/79/10/10.1063/1.2971973
2008-10-31
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Robust measurement of group delay in the presence of density fluctuations by means of ultrafast swept reflectometrya)
http://aip.metastore.ingenta.com/content/aip/journal/rsi/79/10/10.1063/1.2971973
10.1063/1.2971973
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