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PolLux: A new facility for soft x-ray spectromicroscopy at the Swiss Light Source
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10.1063/1.3021472
/content/aip/journal/rsi/79/11/10.1063/1.3021472
http://aip.metastore.ingenta.com/content/aip/journal/rsi/79/11/10.1063/1.3021472
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Figures

Image of FIG. 1.
FIG. 1.

Optical layout of the PolLux beamline (not to scale) showing the bending magnet source followed by the toroidal mirror and the spherical grating monochromator. These create a secondary source at the exit slit (S2) illuminating the FZP which produces the focal spot across which the sample is scanned. The photograph on the right shows several of the beamline components.

Image of FIG. 2.
FIG. 2.

Measured photoion yield at the nitrogen transition using the gas cell located between exit slit and FZP of the PolLux beamline (300 lines/mm grating, slits). The intensity ratio of the first minimum to the third maximum (0.8) indicates an energy resolution in excess of (Ref. 23).

Image of FIG. 3.
FIG. 3.

Resolving power (left scale) and relative intensity (right scale) as function of the entrance slit width measured with the 300 lines/mm grating at an exit slit of . The resolving power has been determined from the spectra shown as insets. The lines indicate the resolving power for equal entrance and exit slits matched to the horizontal focus width at the entrance slit .

Image of FIG. 4.
FIG. 4.

(a) Argon photoion yield measurement for 300 lines/mm grating and exit slit setting. (b) Measured transition series of neon with 600 lines/mm grating.

Image of FIG. 5.
FIG. 5.

Measured photon flux at the sample for the (a) 300 lines/mm grating and (b) 600 lines/mm grating. The entrance slit width has been continuously adjusted with energy to keep the spectral resolving power constant at . The exit slit has been kept constant at . See text for details.

Image of FIG. 6.
FIG. 6.

Scheme showing how circularly polarized light is obtained from a bending magnet by tilting the storage ring orbit relative to the optical axis of the beamline. The beamline acceptance is ; the tilt angle of the orbit is .

Image of FIG. 7.
FIG. 7.

Scheme of a STXM showing the divergent beam downstream of the exit slit, FZP producing a diffraction limited focus, OSA selecting only the first-order focus, the sample, and the detector measuring the transmitted intensity.

Image of FIG. 8.
FIG. 8.

Photographs of the PolLux STXM: (a) inside the experimental hutch and (b) main elements of the setup.

Image of FIG. 9.
FIG. 9.

Magnetic imaging of a CoPt/IrMn multilayer sample (total ). The well known worm domains of about 200 nm width are shown in (a), a spectrum taken at the edge in (b), and the magnetic contrast and relative intensity as a function of bump angle in (c).

Image of FIG. 10.
FIG. 10.

STXM transmission images at (a) 286.5 eV and (b) 284.2 eV of 200 nm thick TCNQ film grown on top of a 5 nm silver film; (c) -edge NEXAFS spectra extracted from line scans taken across bright and dark microcrystallites shown in (b). The line scans were performed with 0.02 eV energy step from 280 to 295 eV with 40 ms dwell time per pixel.

Image of FIG. 11.
FIG. 11.

Climate cell (a) consisting of two silicon wafers with windows and a gas inlet and outlet (not visible). STXM transmission image taken at 540 eV of an individual particle composed of ammonium sulfate and adipic acid is shown in (b). The dependence of the oxygen -edge spectrum of an ammonium sulfate/adipic acid film on the humidity is show in (c). See text for details.

Image of FIG. 12.
FIG. 12.

TEM bright field micrograph of (a) soot particle from wood combustion and (b) diesel soot. Both consist of chains of primary particles. -edge NEXAFS spectra of (c) single soot particles from wood and diesel combustion and (d) from two particles in an atmospheric sample, collected along an arterial road in Zurich.

Image of FIG. 13.
FIG. 13.

STXM transmission images of microballoons in water environment recorded at (a) 520 eV and (b) 550 eV. (c) Oxygen -edge NEXAFS spectra of the surrounding water and the interior parts of microballoons A and B.

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/content/aip/journal/rsi/79/11/10.1063/1.3021472
2008-11-13
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: PolLux: A new facility for soft x-ray spectromicroscopy at the Swiss Light Source
http://aip.metastore.ingenta.com/content/aip/journal/rsi/79/11/10.1063/1.3021472
10.1063/1.3021472
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