1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Broadband dielectric studies on the interfacial dynamics enabled by use of nanostructured electrodes
Rent:
Rent this article for
USD
10.1063/1.2839021
/content/aip/journal/rsi/79/2/10.1063/1.2839021
http://aip.metastore.ingenta.com/content/aip/journal/rsi/79/2/10.1063/1.2839021
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) Schematic representation of the preparation procedure using ultraflat highly conductive silicon wafers as electrodes and silica nanostructures as spacers; (b) matrix of quadratic silica nanostructures acting as spacers on a conductive silicon wafer; (c) image by atomic force microscopy of a silica nanospacer (scan size of ); (d) height profile of the linecut presented in (c).

Image of FIG. 2.
FIG. 2.

(a) Image by atomic force microscopy of an ultrathin P2VP film (scan size of ). The scratch was carried out by using an ultrasharp STM tip. (b) The corresponding heights histrogram; the difference between the position of the two peaks gives the average film thickness .

Image of FIG. 3.
FIG. 3.

Dielectric loss vs temperature at different frequencies, as indicated, showing the dynamic glass transition for a thick layer of poly-2-vinyl-pyridine.

Loading

Article metrics loading...

/content/aip/journal/rsi/79/2/10.1063/1.2839021
2008-02-04
2014-04-19
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Broadband dielectric studies on the interfacial dynamics enabled by use of nanostructured electrodes
http://aip.metastore.ingenta.com/content/aip/journal/rsi/79/2/10.1063/1.2839021
10.1063/1.2839021
SEARCH_EXPAND_ITEM