Cross section of the crystal mounting on a concave glass lens of curvature, diameter, and thickness. The thickness of the crystal slabs is about (curvature and crystal thickness not to scale).
Bragg reflection and focusing condition without and with miscut for a bent crystal setup in the symmetry plane. The left drawing corresponds to the symmetric Bragg case, the right one to the asymmetric one for a miscut orientation (adapted from Ref. 6).
Schematic of the method used for positioning the critical point (Fig. 1) onto the holder rotation axis.
Variation of the reflection angle for second order Bragg diffraction of the x-rays for a quartz crystal [corresponding to (Ref. 8)] and a Si (110) crystal [ (Ref. 8)]. The experimental errors for are smaller than the dots depicting the data points. The solid line is a fit according to Eq. (4).
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