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Volume 79, Issue 4 Front cover image - large version

Volume 79, Issue 4, April 2008

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Index of content:

FEATURED ARTICLE
  • Invited Review Article: Microwave spectroscopy based on scanning thermal microscopy: Resolution in the nanometer range
  • INVITED REVIEW ARTICLE
  • PARTICLE SOURCES, OPTICS AND ACCELERATION; PARTICLE DETECTORS
  • MICROSCOPY AND IMAGING
  • CONDENSED MATTER; MATERIALS
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38d913362403a4a254fa758cb6527ba5 journal.issuezxybnytfddd
Scitation: Review of Scientific Instruments - Volume 79, Issue 4
http://aip.metastore.ingenta.com/content/aip/journal/rsi/79/4
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