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On-chip integration of high-frequency electron paramagnetic resonance spectroscopy and Hall-effect magnetometry
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View: Figures


Image of FIG. 1.
FIG. 1.

(a) Reflection and (b) transmission microstrip line resonators. The coupling and transmission gaps are engineered differently to optimize device performance.

Image of FIG. 2.
FIG. 2.

as a function of frequency for different coupling gaps between the feed line and the central line of a microstrip resonator.

Image of FIG. 3.
FIG. 3.

(a) Reflection and transmission parameters of transmission resonators with several transmission gaps. The color-coded sketches on the right represent the magnitude (in A/m) of the current density in the device at resonance. (b) Measured response of a resonator fabricated on GaAs.

Image of FIG. 4.
FIG. 4.

(a) Sketch of an EPR/HEM integrated sensor. (b) Photograph of the device placed in a low temperature housing box. (c) Optical micrograph of the center part of the resonator. The cross-shaped HEM can be seen underneath the resonator. The green pyramidal-shaped sample is a single crystal of a SMM.

Image of FIG. 5.
FIG. 5.

(a) Black curve: Magnetization response of the SMM crystal at as a function of easy axis magnetic field (a constant transverse field of is also applied). Red curve: The magnetization under microwave excitation applied to the sample. (b) Microwave power absorbed, extracted from the signal transmitted through the resonator, . (c) Microwave-induced change of magnetization extracted from (a).

Image of FIG. 6.
FIG. 6.

(a) Time-resolved magnetization measurements for three different applied longitudinal fields under microwave pulse irradiation. (b) Magnetization curves at six different times, during and after the microwave pulse. The dashed line indicates the resonant field corresponding to the transition between the two lowest-lying tunnel split spin states.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: On-chip integration of high-frequency electron paramagnetic resonance spectroscopy and Hall-effect magnetometry