Schematic layout of 11BM beamline optics.
Pictures of the 11BM (a) 12 analyzer/detector system and (b) robotic sample exchanger.
Rocking curve widths at : (a) Si (111) monochromotor crystal and (b) Si (111) analyzer crystal.
Focused beam profiles at sample position in (a) horizontal and (b) vertical directions.
High-resolution diffraction pattern from NIST standard reference material (660a) at . The inset shows a portion of high data.
Measured FWHM of selected peaks from the diffraction data shown in Fig. 5: (a) as measured (symbol) and fit (line) to the IRF, as discussed in section IVc; (b) as a Williamson–Hall plot; (c) expressed in wavelength-independent units as .
Rietveld refinement using a high-resolution diffraction pattern from a mixture of two NIST SRM materials [ Si (640c) and (676)]. Crosses indicate averaged data from the combination of the 12 detectors, the red solid line shows the computed results, while the green line shows the fitted background. The blue line at the bottom shows the difference between the observed and computed results.
Selected diffraction peaks repeatedly measured at over the course of time (a) for a representative high-angle peak during a few-hours scan ; (b) and (c) representative peaks at high angle and low angle, respectively, for (Si and mixture).
Article metrics loading...
Full text loading...