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The advanced ion-milling method for preparation of thin film using ion slicer: Application to a sample recovered from diamond-anvil cell
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10.1063/1.3058760
/content/aip/journal/rsi/80/1/10.1063/1.3058760
http://aip.metastore.ingenta.com/content/aip/journal/rsi/80/1/10.1063/1.3058760
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Schematic illustration of Ar-ion beam irradiation to a sample with an initial thickness of in ion slicer. (Left) Argon ion source and the sample holder rocks ±6.0° and ±30°, respectively. (Right) A side view of the specimen block.

Image of FIG. 2.
FIG. 2.

Schematic illustrations of the procedures before ion milling. (a) A sample retrieved from a DAC experiment is detached together with a Re foil gasket. (b) It is then placed on a Si wafer. The specimen block is thinned to thick and mounted under a shield belt in Ion Slicer. (c) An image taken by CCD camera in the ion slicer.

Image of FIG. 3.
FIG. 3.

Procedures of milling with ion slicer. (a) First milling; the sample block is thinned to thickness identical with that of a shield belt. (b) Second milling; the shield belt is removed, and the specimen block is placed upside down. The time passed since the beginning of milling is shown.

Image of FIG. 4.
FIG. 4.

TEM image of a thin film of mixed with platinum served as laser absorber. Note the almost uniform thickness over a wide area.

Image of FIG. 5.
FIG. 5.

TEM image of recovered from 110 GPa and 2000 K. The thin film shows the entire cross section of a DAC sample along the compression axis.

Image of FIG. 6.
FIG. 6.

(a) Back scattered electron image and (b) corresponding thickness map of a recovered DAC sample obtained by a FE-EPMA and representative thickness assuming the density to be . This sample is a natural basaltic rock and a small amount of Iridium metal at the edge of the film. Thin region with the thickness below 100 nm has dimensions of .

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/content/aip/journal/rsi/80/1/10.1063/1.3058760
2009-01-05
2014-04-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: The advanced ion-milling method for preparation of thin film using ion slicer: Application to a sample recovered from diamond-anvil cell
http://aip.metastore.ingenta.com/content/aip/journal/rsi/80/1/10.1063/1.3058760
10.1063/1.3058760
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