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Internal frequency conversion extreme ultraviolet interferometer using mutual coherence properties of two high-order-harmonic sources
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10.1063/1.3257676
/content/aip/journal/rsi/80/11/10.1063/1.3257676
http://aip.metastore.ingenta.com/content/aip/journal/rsi/80/11/10.1063/1.3257676
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Experimental setup.

Image of FIG. 2.
FIG. 2.

Principle of interference construction. The virtual sources, and from XUV point sources and (not reported here for clarity). Part of the reference arm is not reported here and angle is larger than in reality for more readability. Virtual sources at a distance from the object plane, act as Young’s sources and generate interferences. A schematic view of the interference in the virtual object plane is reported, where the object and fringes are superimposed. Note that the virtual object/interferogram plane is centered onto the optical axis of the imaging device. Therefore, the real object is centered onto the image of the real optical axis into the reflecting face (angle ), which is not the case of the real source (angle ).

Image of FIG. 3.
FIG. 3.

Photos of the silica prism (a) and of the “plane mirror–ellipsoidal mirror” ensemble (b) manufactured by the LCFIO-Orsay.

Image of FIG. 4.
FIG. 4.

Typical interferogram measured in the detector plane at 32 nm (left). The normalized intensity horizontal profile along the AB chord (right).

Image of FIG. 5.
FIG. 5.

Normalized visibility of fringes as a function of temporal delay between the two XUV arms of the interferometer.

Image of FIG. 6.
FIG. 6.

Reference interferogram without plasma (a). Self-emission from plasma created by irradiation of solid aluminum target at maximum intensity of (b).

Image of FIG. 7.
FIG. 7.

Profiles corresponding to reference signal from Fig. 6(a), without plasma, and to self-emission from plasma created by irradiation of solid aluminum target at maximum intensity of , from Fig. 6(b).

Image of FIG. 8.
FIG. 8.

2D phase map reconstructed for 1.1 ns delays between IR pump and XUV probe (a) and experimental electron density profile associated (b). The aluminum target is irradiated at , the laser is incident from the left.

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/content/aip/journal/rsi/80/11/10.1063/1.3257676
2009-11-03
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Internal frequency conversion extreme ultraviolet interferometer using mutual coherence properties of two high-order-harmonic sources
http://aip.metastore.ingenta.com/content/aip/journal/rsi/80/11/10.1063/1.3257676
10.1063/1.3257676
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