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Schematic diagram of PRC dilatometer. A commercial PRC for AFM is mounted on a stepped silicon substrate with its tip (facing up) resting on the sample that is glued on the upper part of the substrate. The resistance change between the sample piezo and reference piezoelements due to the dimensional change in sample is monitored using a Wheatstone bridge technique.
Piezoresistive dilatometer placed on top of the capacitive titanium dilatometer with a diameter of 19.0 mm (a). (b) and (c) show details of the piezoresistive dilatometer and sample mounting.
CDW transitions in alpha uranium probed by transport (top panel), capacitive dilatometer (middle), and piezoresistive dilatometer (bottom). The dilatometery measurements were taken simultaneously with the PRC dilatometer glued to the top of the capacitance dilatometer as shown in Fig. 2. Dilatometer traces at different magnetic fields are not corrected for cell effects and offset along the -axis for clarity. The of piezoresistive dilatometer (bottom) was measured without a preamplifier. The dilations (in both dilatometers) measured at 31 T (not shown here) also showed similar CDW transition temperatures. Note that the thickness of sample in capacitive dilatometer is 10 times thicker than that of the piezoresistive dilatometer.
Sensitivity of PRC dilatometer in pulsed (a) and dc magnetic fields (b). (a) Magnetostriction of an organic compound, was measured in a pulsed magnetic field at 1.7 K and shows a MI transition around 36 T. (b) quantum oscillations of a heavy fermion compound, measured in dc magnetic fields at 1.6 and 6 K. (c) Fast-Fourier transforms of the quantum oscillations presented in panel (b).
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