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Electrically detected magnetic resonance using radio-frequency reflectometry
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10.1063/1.3258206
/content/aip/journal/rsi/80/11/10.1063/1.3258206
http://aip.metastore.ingenta.com/content/aip/journal/rsi/80/11/10.1063/1.3258206
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Panel (a) shows the EDMR detection setup including the low frequency, the microwave, and the rf circuitry. The inset shows a scanning electron micrograph of the silicon MOSFET. Panel (b) shows the calibration curve that translates the source-drain conductance/current to the reflected rf signal amplitude after homodyning . At 30 nA a matching point is observed. The red and blue lines are guides to the eye and show a slope of −57.9 and 48 mV/nA, respectively.

Image of FIG. 2.
FIG. 2.

EDMR using different detection schemes. Panel (a) shows the EDMR signal obtained by monitoring the lock-in amplified source drain current. Panel (b) shows the reflected rf signal from the circuit using homodyne detection, lock-in amplification, and conversion to a current scale using Fig. 1(b) with a 25-fold increased signal to noise. Panel (c) shows the absolute (converted) current change, monitored directly by measuring with a storage oscilloscope.

Image of FIG. 3.
FIG. 3.

Frequency modulation rate dependence of the signal amplitudes for conventional EDMR and rfEDMR detection. The blue circles represent the peak-to-peak amplitude of the conduction band electron ESR signal using conventional EDMR, decreasing at . The rfEDMR lock-in signal (black circles) matches the conventional EDMR data up to and shows no decrease up to 100 kHz. Using a digital storage oscilloscope was recorded up to and the lock-in response determined numerically (black squares). Here, the signal amplitude starts to drop at about 300 kHz, attributed to the voltage preamplifiers used.

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/content/aip/journal/rsi/80/11/10.1063/1.3258206
2009-11-11
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Electrically detected magnetic resonance using radio-frequency reflectometry
http://aip.metastore.ingenta.com/content/aip/journal/rsi/80/11/10.1063/1.3258206
10.1063/1.3258206
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