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Frequency-resolved optical gating system with a tellurium crystal for characterizing free-electron lasers in the wavelength range of
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10.1063/1.3265318
/content/aip/journal/rsi/80/12/10.1063/1.3265318
http://aip.metastore.ingenta.com/content/aip/journal/rsi/80/12/10.1063/1.3265318

Figures

Image of FIG. 1.
FIG. 1.

Computational solutions of the coupled differential equations along the crystal length for FEL powers of 400, 800, and .

Image of FIG. 2.
FIG. 2.

Layout of the SHG-FROG system. Cry, frequency-doubling Te crystal; BS, beam splitter; RR, retroreflector; OD, optical delay; PM, parabolic mirror.

Image of FIG. 3.
FIG. 3.

(a) Measured trace and (b) retrieval trace.

Image of FIG. 4.
FIG. 4.

Intensity profile (solid line) and phase (dashed line) of the retrieved pulse in the time domain. Pulse duration at FWHM is 0.6 ps.

Image of FIG. 5.
FIG. 5.

SHG autocorrelation intensity profiles. Solid and dashed lines indicate the profile calculated from the retrieved pulse and the measured pulse, respectively.

Image of FIG. 6.
FIG. 6.

Spectral intensity profiles and phase. Solid, dashed, and dotted lines represent the profile of the retrieved pulse, the spectral phase, and the measured spectrum, respectively. Further, 0 THz corresponds to a FEL wavelength of . The spectral width at FWHM is 5.2 THz.

Tables

Generic image for table
Table I.

Physical properties of Te crystal.

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/content/aip/journal/rsi/80/12/10.1063/1.3265318
2009-12-07
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Frequency-resolved optical gating system with a tellurium crystal for characterizing free-electron lasers in the wavelength range of 10–30 μm
http://aip.metastore.ingenta.com/content/aip/journal/rsi/80/12/10.1063/1.3265318
10.1063/1.3265318
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