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High energy x-ray diffraction/x-ray fluorescence spectroscopy for high-throughput analysis of composition spread thin films
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10.1063/1.3274179
/content/aip/journal/rsi/80/12/10.1063/1.3274179
http://aip.metastore.ingenta.com/content/aip/journal/rsi/80/12/10.1063/1.3274179
/content/aip/journal/rsi/80/12/10.1063/1.3274179
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/content/aip/journal/rsi/80/12/10.1063/1.3274179
2009-12-28
2014-09-02
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: High energy x-ray diffraction/x-ray fluorescence spectroscopy for high-throughput analysis of composition spread thin films
http://aip.metastore.ingenta.com/content/aip/journal/rsi/80/12/10.1063/1.3274179
10.1063/1.3274179
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