1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
An instrument for combining x-ray multiple diffraction and x-ray topographic imaging for examining crystal microcrystallography and perfection
Rent:
Rent this article for
USD
10.1063/1.3103571
/content/aip/journal/rsi/80/3/10.1063/1.3103571
http://aip.metastore.ingenta.com/content/aip/journal/rsi/80/3/10.1063/1.3103571
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Details of the TMDM instrumental setup: (a) schematic representation; (b) close-up photograph of the completed instrument showing coordination table, x-ray tube head and slit collimation system, multicircle APEX diffractometer, sample stage, and the two concentric detector circles: (1) X-ray tube, (2) collimator with mounted slits to control beam size and divergence, (3) Eulerian cradle with translation, (4) proportional counter and PSD detector; (c) data acquisition system including PC system, CAMAC/NIM electronics, and McLennan stepper motor controllers.

Image of FIG. 2.
FIG. 2.

004 rocking curve of GaAs single crystal.

Image of FIG. 3.
FIG. 3.

XRT and intensity map of GaAs crystal (the red spot in the left figure represents the location of incident X-ray beam for 002 RS).

Image of FIG. 4.
FIG. 4.

Renninger XRMD scan of GaAs crystal using a 002 primary reflection and its comparison with the calculated RS using UMWEG program.45

Image of FIG. 5.
FIG. 5.

200 transmission x-ray topograph of KDP crystal with doping (Numbers corresponding to eight locations of 004 RS).

Image of FIG. 6.
FIG. 6.

004 RS at clear and doped regions ( and in Fig. 5) of doped KDP crystal and pure KDP using TMDM system .

Loading

Article metrics loading...

/content/aip/journal/rsi/80/3/10.1063/1.3103571
2009-03-27
2014-04-17
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: An instrument for combining x-ray multiple diffraction and x-ray topographic imaging for examining crystal microcrystallography and perfection
http://aip.metastore.ingenta.com/content/aip/journal/rsi/80/3/10.1063/1.3103571
10.1063/1.3103571
SEARCH_EXPAND_ITEM