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A simple atomic force microscopy calibration method for direct measurement of surface energy on nanostructured surfaces covered with molecularly thin liquid films
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10.1063/1.3136908
/content/aip/journal/rsi/80/5/10.1063/1.3136908
http://aip.metastore.ingenta.com/content/aip/journal/rsi/80/5/10.1063/1.3136908
/content/aip/journal/rsi/80/5/10.1063/1.3136908
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/content/aip/journal/rsi/80/5/10.1063/1.3136908
2009-05-21
2015-01-30
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: A simple atomic force microscopy calibration method for direct measurement of surface energy on nanostructured surfaces covered with molecularly thin liquid films
http://aip.metastore.ingenta.com/content/aip/journal/rsi/80/5/10.1063/1.3136908
10.1063/1.3136908
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