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Experimental demonstration of high quality MeV ultrafast electron diffraction
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10.1063/1.3194047
/content/aip/journal/rsi/80/8/10.1063/1.3194047
http://aip.metastore.ingenta.com/content/aip/journal/rsi/80/8/10.1063/1.3194047

Figures

Image of FIG. 1.
FIG. 1.

The schematic of the MeV UED setup at TTX facility. (1) Photocathode RF gun. (2) Magnetic solenoid. (3) Sample chamber. (4) Deflecting cavity. (5) Steering coils. (6) 3 m drift tube. (7) Detector chamber.

Image of FIG. 2.
FIG. 2.

A simulated diffraction pattern (a) and the corresponding scattering intensity (b). See text for details. (c)–(f) show changes in widths and separations of the (111) and (200) rings when one parameter is changed while others remain roughly the same.

Image of FIG. 3.
FIG. 3.

Measured diffraction pattern (a) and corresponding scattering intensity (b) retrieved from the indicated triangular area in (a), together with the simulated one. See text for details.

Tables

Generic image for table
Table I.

Estimated electron pulse parameters entering the sample.

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/content/aip/journal/rsi/80/8/10.1063/1.3194047
2009-08-18
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Experimental demonstration of high quality MeV ultrafast electron diffraction
http://aip.metastore.ingenta.com/content/aip/journal/rsi/80/8/10.1063/1.3194047
10.1063/1.3194047
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