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Delay scan and gate width control system. (a) Block diagram of electronics and the timing chart. (b) Oscilloscope capture of the gate, laser trigger, and TOF signal. The integration of the signal is enabled when the gate signal goes to 0 V.
Normalized TOF signals for various bias voltages. For 5 V signal, the flight time could not be determined.
Signal processing of the TOF signal biased to 5 V. (a) Integrated photocurrents and fitted curves for plateau and tail regions, respectively. Each hollow triangle was obtained from boxcar integrator output, where the gate width was set to 32 μs and delay was set to . Inset indicates the original TOF signal, where the flight time cannot be determined. (b) Recovered signals obtained by differentiating the curves of Fig. 3(a).
Hole mobilities of NPB thin film as a function of square root of the electric field. Left inset indicates the cross sectional view of the film. Right inset show the schematics of the TOF measurement apparatus.
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