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Improved in situ spring constant calibration for colloidal probe atomic force microscopy
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10.1063/1.3502460
/content/aip/journal/rsi/81/11/10.1063/1.3502460
http://aip.metastore.ingenta.com/content/aip/journal/rsi/81/11/10.1063/1.3502460

Figures

Image of FIG. 1.
FIG. 1.

ac mode image of the HTS colloidal probe at the point of contact.

Image of FIG. 2.
FIG. 2.

(a) Residuals from fitting V-theory to run five in decanol using the HTS system; in situ (upper line), residuals (middle), and thermal ( calibrated in air) (lower). (b) Residuals for octane and hexadecane using fixed for HTS system.

Image of FIG. 3.
FIG. 3.

(a) Force, (b) velocity, and (c) expansion representation [Eq. (7)] for decanol run five HTS system. Inset A demonstrates that hard contact was made on approach at zero separation.

Image of FIG. 4.
FIG. 4.

Free oscillation amplitude/PSD voltage signal in air as a function of the LVDT signal for a noncolloidal NP-S series probe from Veeco.

Image of FIG. 5.
FIG. 5.

Cantilever drag force in decanol determined for a noncolloidal NP-S series probe at a height of from the surface.

Tables

Generic image for table
Table I.

Silicon wafer and colloidal probe surface characteristics.

Generic image for table
Table II.

Summary of spring constants and slip lengths at cantilever velocity.

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/content/aip/journal/rsi/81/11/10.1063/1.3502460
2010-11-08
2014-04-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Improved in situ spring constant calibration for colloidal probe atomic force microscopy
http://aip.metastore.ingenta.com/content/aip/journal/rsi/81/11/10.1063/1.3502460
10.1063/1.3502460
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