1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
A low noise all-fiber interferometer for high resolution frequency modulated atomic force microscopy imaging in liquids
Rent:
Rent this article for
USD
10.1063/1.3297901
/content/aip/journal/rsi/81/2/10.1063/1.3297901
http://aip.metastore.ingenta.com/content/aip/journal/rsi/81/2/10.1063/1.3297901
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Experimental setup for the fiber optic interferometer deflection sensor.

Image of FIG. 2.
FIG. 2.

Schematic of the fiber positioning assembly. Computer-aided design (CAD) drawing of the (a) assembled and (b) exploded view of the assembly required for course and fine positioning of the fiber optic cable over a mirror or cantilever.

Image of FIG. 3.
FIG. 3.

Calculated interference patterns and deflection noise densities with varying reflectivities. (a) Fringe pattern and the (b) absolute magnitude of the corresponding slope for varying values with a of 1.0 mW. The values used in (a) and (b), in order of largest maximum reflected power and maximum slope values to smallest, are as follows: 0.74, 0.40, 0.15, and 0.04. (c) The variation in deflection noise density due to the photodiode shot noise at varying reflectivities with set to the maximum operating slope. The index of refraction for air, , and a was used for all calculations.

Image of FIG. 4.
FIG. 4.

Calculated interference patterns and deflection noise densities with varying incident power. (a) Fringe pattern and (b) absolute value of the corresponding slope for varying s when . The values for (a) and (b), in order of largest maximum reflected power and maximum slope values to smallest, are as follows: , , , and . The index of refraction for air, , and a was used for all calculations. (c) Variation of the deflection noise density due to the photodiode shot noise for three different reflectivities as the incident power is varied. Parameters for (c) are as follows: bare water: , ; bare air: , ; coated: , . In all calculations . It is important to note that at each new reflectivity value a new is determined and used in the calculations.

Image of FIG. 5.
FIG. 5.

Comparison of the (a) ideal interference pattern to experimentally acquired data and the (b) absolute value of the corresponding slope obtained between a cleaved fiber optic cable with a dielectric reflective coating and a silicon wafer coated with 30 nm of evaporated gold. The parameters used for the calculation are as follows: , , , and .

Image of FIG. 6.
FIG. 6.

(a) Sensitivity and (b) deflection noise density at varying incident powers. The solid dotted lines (black) are the experimentally measured values and the dashed lines (gray) are calculated for an ideal interference cavity. The parameters used for the calculations are the following: , , , , , and .

Image of FIG. 7.
FIG. 7.

Typical interference pattern in (a) air and (b) water between a fiber optic end face and cantilever (Nanosensors: PPP-NCHAuD) backside used for FM-AFM imaging. A sweep distance of 1984.4 nm was performed in both (a) and (b). It is important to note that no change in alignment occurred between the two measurements.

Image of FIG. 8.
FIG. 8.

Frequency spectra of a cantilever (Nanosensors: PPP—NCHAuD) thermal Brownian motion measured in (a) air and (b) water. The lines with circles are experimentally measured values and the dashed lines are theoretically calculated values using Eq. (12). The parameters used in calculating (a): , , , and . The parameters used for (b): , , , and . It is important to note that no change in alignment occurred between the two measurements.

Image of FIG. 9.
FIG. 9.

Schematic of the experimental setup used for FM-AFM imaging using the developed fiber optic deflection sensor.

Image of FIG. 10.
FIG. 10.

True atomic resolution FM-AFM image of muscovite mica acquired in pure water. The image (, , , Scan ) was acquired with a commercial cantilever (Nanosensors: PPP—NCHAuD).

Loading

Article metrics loading...

/content/aip/journal/rsi/81/2/10.1063/1.3297901
2010-02-02
2014-04-18
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: A low noise all-fiber interferometer for high resolution frequency modulated atomic force microscopy imaging in liquids
http://aip.metastore.ingenta.com/content/aip/journal/rsi/81/2/10.1063/1.3297901
10.1063/1.3297901
SEARCH_EXPAND_ITEM