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Complex permittivity measurements using cavity perturbation technique with substrate integrated waveguide cavities
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10.1063/1.3442512
/content/aip/journal/rsi/81/6/10.1063/1.3442512
http://aip.metastore.ingenta.com/content/aip/journal/rsi/81/6/10.1063/1.3442512

Figures

Image of FIG. 1.
FIG. 1.

Layout of the SIW cavity 1.

Image of FIG. 2.
FIG. 2.

-field distribution of the SIW cavity and allocation of the sample.

Image of FIG. 3.
FIG. 3.

Experimental response of the cavity with various materials.

Image of FIG. 4.
FIG. 4.

Experimental sensitivity of cavity 1: (a) resonant frequency vs sample dielectric permittivity and (b) 3 dB bandwidth vs sample dielectric loss tangent.

Image of FIG. 5.
FIG. 5.

Fractional change in resonant frequency vs sample permittivity values.

Tables

Generic image for table
Table I.

Characterized values from simulations using CPT for SIW.

Generic image for table
Table II.

Characterized values of materials from measurements.

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/content/aip/journal/rsi/81/6/10.1063/1.3442512
2010-06-11
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Complex permittivity measurements using cavity perturbation technique with substrate integrated waveguide cavities
http://aip.metastore.ingenta.com/content/aip/journal/rsi/81/6/10.1063/1.3442512
10.1063/1.3442512
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