Spatial arrangement of 15 sight lines of soft x-ray PHA system on EAST horizontal port.
Expanded schematic of the soft x-ray PHA diagnostic system shown in Fig. 1.
Calibrated spectra of the SDD using standard x-ray sources including (5.9 keV), (8.0 keV), and (13.4 keV).
Schematic of the electronics associated with the diagnostic system.
Time history of EAST shot 11971 with LHW-heated discharge. (a) is the plasma current, (b) loop voltage, (c) the chord-averaged electron density at position, (d) the LHW power, (e) the hard x-ray intensity from central chord along the tangential direction, (f) the soft x-ray intensity from channel 9 viewing along central chord, and (g) the central chord-averaged electron temperature obtained from soft x-ray PHA system with 200 ms time resolution.
Two raw soft x-ray spectra of shot 11971 plasma measured with central chord SDD detector at (solid squares) and (solid circles) which correspond to Ohmic heating phase and LHCD phase, respectively. The electron temperatures can be calculated from the slope of the fitted solid lines shown in the figure.
Radial profiles of electron temperatures at (open squares) and (open circles) of shot 11971, which was obtained from soft x-ray PHA system, respectively. profile data at derived from TS system are also shown in the figure (solid circles) for comparison.
Intensity profiles of line emissions of Ti, Cr, Fe, and Cu impurities derived from soft x-ray PHA system at for shot 11971. Each point in the figure denotes the line-integrated intensity along a sight line of the SDD detector.
Time evolutions of intensities of Ti, Cr, Fe, and Cu impurities measured with central chord SDD detector. The gray rectangle here represents the time of the LHW injection.
Detailed filter and pinhole combinations which are possible for 15-channel SDD linear array on EAST.
Exact arrangement of filter and aperture for each channel of SDDs that were used for the soft x-ray PHA measurement of shot 11971.
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