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Note: Mechanical and electrical characterization of nanowires in scanning electron microscope
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10.1063/1.3647222
/content/aip/journal/rsi/82/10/10.1063/1.3647222
http://aip.metastore.ingenta.com/content/aip/journal/rsi/82/10/10.1063/1.3647222
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Schematic of MEMS device for tensile testing.

Image of FIG. 2.
FIG. 2.

Nanowire-transfer procedure and testing results. (a) Nanowire is EBID-soldered to probe tip and detached from growth substrate. (b) Nanowire is EBID-fixed to two edges of gap, followed by probe retraction. (c) Tensile testing results of SnO2 nanowire. Young's modulus is determined to be 116.0 GPa.

Image of FIG. 3.
FIG. 3.

Feedforward control method. (a) SEM image-based visual servo control system incorporating a feedforward controller. (b) Step responses of visual servo control system for one axis of piezoelectric tube with and without feedforward control.

Image of FIG. 4.
FIG. 4.

Four-point probe on SnO2 nanowire. (a) Four probes landing on target positions. (b) IV data of nanowire with regard to different separations between two inner probes.

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/content/aip/journal/rsi/82/10/10.1063/1.3647222
2011-10-24
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Note: Mechanical and electrical characterization of nanowires in scanning electron microscope
http://aip.metastore.ingenta.com/content/aip/journal/rsi/82/10/10.1063/1.3647222
10.1063/1.3647222
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