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Studying single nanocrystals under high pressure using an x-ray nanoprobe
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View: Figures


Image of FIG. 1.
FIG. 1.

The schematic diagram of the experimental setup at the 2ID-D; the inset of knife edge scan profile shows that the beam size is ∼250 nm.

Image of FIG. 2.
FIG. 2.

Two-dimensional x-ray fluorescence mapping of Se K-line of the sample in the diamond anvil cell: 60 × 100 μm2 two-dimensional mapping with the step size is 1 μm (a), 10 × 15 μm2 two-dimensional mapping of the rectangle in Fig. 2(a) with a smaller step size of 500 nm (b). X-ray fluorescence intensity along the lines marked in Figs. 2(b) and 2(c).

Image of FIG. 3.
FIG. 3.

An XRD pattern taken at the location marked by the arrow in Fig. 2(b) at ambient pressure in a diamond anvil cell (a), and the integrated XRD spectrum (b). The exposing time for the diffraction pattern is 180 s. The schematic diagram of the single crystal diffraction of a single nanobelt (c).

Image of FIG. 4.
FIG. 4.

XRD patterns for the same nanobelt collected at different rotation angles.

Image of FIG. 5.
FIG. 5.

XRD patterns taken at the same location in Fig. 3(a) at different pressures (a) and the d-spacing as the function of pressure (b).


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Studying single nanocrystals under high pressure using an x-ray nanoprobe