Schematic top-view of the AS-3 beamline and end-station. Details of the various degrees of freedom of sample, preparation tools, detectors, and the end-station are given in Fig. 3. The back plate of the preparation chamber is rotatable so that the manipulator with the sample can be moved to different ports for target preparation and characterization before the sample is inserted into the measurement chamber.
Measured high harmonic spectrum (corrected for reflectivity of the grating and metal filter transmission of 950 nm of Zr) (solid curve). Calculated net XUV transmission used in the reported xenon experiment (based on XUV mirror reflectivity and transmission of a 200 nm Zr metal filter) (dotted curve).
Cross-sectional view of the rotary part of the measurement chamber. The various degrees of freedom for positioning are indicated by dashed arrows.
(a) Photoelectron spectra of a multilayer of xenon condensed on a Re(0001) substrate taken at the start and the end of a streaking scan with an integration time of 0.5 min (35 min total duration) illustrating the long-term stability of the xenon multilayer. (b) False-color plot showing the full streaking scan of the xenon 4d state. The retrieved attosecond XUV pulse is shown in the small inset. The kinetic energy is referenced to the vacuum level, the spectra, and the spectrogram have been corrected for NIR-induced space charge effects.
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